SCATTERING MEASUREMENTS

Light Tec offers services such as scattering measurements (BSDF for Bidirectional Scattering Distribution Function) and also provides its own instruments (scattering measurement systems).

Being a pioneer in the optical branch that is the scattering measurement, Light Tec has become an expert in this field and performed a large number of projects over the years. The expertise of our team into the optics field (optical engineers and PhD laser optics) and the quality of our photometric laboratory allow Light Tec to offer the best solutions for our customers.

The measurement activity is an additional service to our optical design software LightTools, LucidShape and Code V. It was first created to build the software libraries in order to help designers with real and accurate data.

On top of that, Light Tec has its own R&D department where the Mini-Diff V2 and REFLET 180S are being developed. Both instruments can be used to do scattering measurement by yourself if you need to analyze lots of samples whatever your applications are.
These devices are also used by our technical team in our photometric laboratory. If you would like a demonstration in our office (Hyères, France), you can ask our team for an appointment.
The R&D department is also responsible for the improvement of the equippment in the laboratory, especially for our high specular measurement system.

Customer’s references: Automotive Lighting, BARCO, Bayer, Bosch, Broadcom, CREE, ESA, Nikon, Osram, Philips, Thales, VARROC, Sordern, Visteon….

MINI-DIFF V2

Mini-Diff V2 is a compact and portable optical system for scattering characterization: measure the BRDF & BTDF of any kind of materials and objects. With Mini-Diff V2 you can measure in a fast and easy way, the luminous energy distribution and consequently characterizes surfaces of your examined regions such as roughness, defects as well as types of coatings or paintings and more.

From the Plug & Play functionality to the technical specifications, Mini-Diff V2 is a great device which allows you to save time and money thanks to the facility to measure and the quality of the results. If you often need to measure samples or surfaces outside the office, Mini-Diff V2 is still the best solution for you!

Mini-Diff V2 is the second version of the instrument including new improvements:

  • Measurements of BSDF in red, green, and blue (RGB)
  • TIS measurements for RGB
  • Dynamic range has been increased to 105
  • Colorimetric data: Lab or u’v’

BSDF Measurement Breakdown:
BRDF is measured for 4 angles of incidence (AOI): 0°, 20°, 40° and 60°.
BTDF transmissive module now measures 4 AOIs.

You can find more technical information in our brochure (see link below).

The Mini-Diff V2 is really easy to use. A measurement takes less than 1 minutes*:

  1. Plug the Mini-Diff to a computer
  2. Launch the Mini-Diff software on the computer
  3. Calibrate the instrument with the calibration standards
  4. Measure your material
  5. See the result on the software
  6. Export the result

*Calibration and measurement for one angle of incidence and one wavelength.

Measurements can be exported to those following format:
ASTM (text) / LightTools ® native / TracePro ® native / Slice Format (intensity) / Gaussian & Lambertian / ABg Harvey Shack models

Measurements can be imported into commercial optical software: LightTools®, TracePro® and more.
The list is available upon request.

Mini-Diff V2 is delivered with its own suitcase which include the calibration standards, the software, the notice and the cables.

Mini-Diff is a portable optical system for scattering characterization: measure the BRDF & BTDF of any surfaces. It measures in a fast and easy way, the luminous energy distribution, and consequently characterizes surfaces of your examined regions such as roughness, defects, as well as types of coatings or paintings and more. Scattering measurements system, optical measurements system, BSDF
Mini-Diff software: example of a BRDF measurement with a Spectralon sample (Lambertian standard). BSDF, optical scattering measurements, visible, surface characterization.

EXAMPLES

Please, access to more info on the following examples in details:

You can download the Evaluation package with all the examples as reflector, diffuser and paint.

REFLET 180S®

REFLET 180S is a unique stand-alone scattering measurements system.

REFLET 180S is especially suited for back/forward scatter light characterization for all types of materials and objects. It allows you to measure the light distribution contained in the radiation lobe of these materials in photometric and colorimetric terms. Moreover, the system measures BRDF & BTDF which perfectly represents the way any surface scatters incoming light in 3D space.

The accurate analysis of the shape of the radiation lobe surface in terms of roughness, defects (presence as grooves or scratches), ordered microstructures and more. The determination of the spectral composition observed in every direction gives information on the type of paint or covering, and eventually, can characterize the signature of fluorescence, OVI inks, or iridescence with angular variation of colours, and both thin and filtered layers. Lastly, the spectrophotometric cartography of the backscattered light analyses the chemical composition on the surface area of the object for oxidation, dirt, pollution and more.

The system is structured in a modular fashion. It can easily be modified to user requirements, measurement with integrated flux or spectral analysis, or with a white light coloured lighting. The REFLET 180S optical bench is also easy to use as manually for spot inspection or quick analysis.

REFLET 180S allows you to analyse by yourself all samples you need to characterize, with a higher accuracy, exactness and reliability (than Mini-Diff). The device is suited for laboratory uses. It will allow you to get efficient data to import into your optical design software. Afterwards, you will be able to get free time through the production in masked time, as well as earn money, thanks to the quality of REFLET 180S and its analyses that will operate in your final projects!

The instrument is delivered with its dark box.
REFLET 180S software enables measurements exportation to optical design or other illumination software.

REFLET 180S is a scatterometer (scattering measurements systems) which measure BRDF and BTDF in 3D space. It allows you to characterize all types of materials and objects. BSDF, optical scattering measurements, optical surface characterization, visible, infrared, UV
REFLET 180S software: example of a BRDF measurement at 30°. BSDF, optical scattering measurements, optical surface characterization, visible, infrared, UV

EXAMPLES

You can download application notes (pdf) for more information on our system:

InstrumentsMini-Diff V2®REFLET 180S®High Specular
Measurement of light ScatteringARS/BRDF/BTDFARS/BRDF/BTDFARS/BRDF/BTDF
Wavelength Light Source465 - 525 - 630 nmHalogen white lamp + passband filter Discrete values from 280nm to 10.6µm
Wavelength Detector SensitivityNAVIS
IR 900-1700nm
optional Spectrometer [400-800]nm
NA
Angles of incidence Fixed for BRDF and BTDF : 0°, 20°, 40° and 60°Tunables : For BRDF and BTDF : from 0° to +90°Tunables: for BRDF : from 5° to +90°
For BTDF : From 0° to +90°
Angular range3D spherical measurement2D and 3D spherical measurement2D spherical measurement
Spot Size (diameter)> 1mm1mm to 13mm continous 2mm to 14mm depending on wavelenghts
Observed Area Size∅ 1mm ∅ 6mm /∅ 8mm /∅ 14mmNA
Beam DivergenceNA+/- 2.26° to +/- 0.15°+/- 0.01° for visible +/-0.1° for IR
Incident beam positioning precisionNA0.001° +/- 0.001°
Detector Acceptance Angle +/- 0.5° +/- 0.04° / 1.1° / 2°+/- 0.001°
Detector positioning precisionNA0.001°NA
Measurement resolution0.01°/0.1°/1°/10°0.001°
Global axes aligment < 0.5°0.002°
Accuracy< 5%< 1%< 1%
Repetability< 2%< 1%< 1%
Minimum BRDF10e-2< 10e-4< 10e-7 (10e-5 for IR)
Dynamic Range10e510e9 for visible and 10e7 for IR10e13 for visible and 10e9 for IR
Minimum signature+/- 1° for BTDF at 0° at 525nm +/- 0.15° +/- 0.01° for visible and +/- 0.1° for IR
Weight2 Kg80 KgNA
Dimensions10 x 10 x 30 cm107 x 98 x 124 cmNA
AdvantagesPlug & Play
Easy to use & Fast
Portable & Compact
Attractive cost
High dynamic range
High precision
High repeatability
Customisable wavelength range
Very high dynamic range
Measurement at 0.02° from the specular
High precision
High repeatability
Customisable wavelength range

Services

Scattering measurement is also known as BSDF for Bidirectional Scattering Distribution Function. The BSDF determines the surface characterization of materials, objects or all kinds of surfaces through the light dispersion. The measurement can be done in reflection (BRDF) or in transmission (BTDF).

Scattering measurements available from us:

  • 2D & 3D BSDF (Front & Back) measurements
  • High resolution BSDF
  • Spectral BSDF
  • TIR (Total Intern Reflectivity) measurements
  • TIS (Total Integrated Scatter) measurements
  • From UV (280 nm), trough Visible, up to IR 3.39 and 10.6 microns

Our measured data are delivered in text format. Then, all data can be imported in every optical design software!

Light Tec has also developed an refractometer dedicated to the refractive index measurements of optical plastic (PMMA) plates with absolute accuracy of ±0.001 and with high repeatability (better than 1%).

In May 2014, Light Tec moved to a new place and created a new laboratory especially dedicated to measurement.

The laboratory is a black room to avoid any inconvenient stray light and the temperature is controlled and regulated for optimal measurement environment.

We have now a class 100 (ISO 5).

In our laboratory, we do have several instruments : integrating spheres (6”, 8” and 40” inch), two goniophotometers (REFLET 180S), a high specular scatterometer, a lux meter and luminance meter, a spectrophotometer, a videophotometer and many sources, filters and lasers.

Photometric Laboratory: Light Tec has its own black room fully equiped. The laboratory is ISO 8 and 5 (clean room especially for the high specular system). The temperature and humidity are controlled for optimal measurement environnement. BSDF, optical scattering measurements, optical surface characterization, visible, infrared, UV
Photometric Laboratory- Clean room ISO 5 - High Specular System: Light Tec has its own black room fully equiped. The laboratory is ISO 8 and 5 (clean room especially for the high specular system). BSDF, optical scattering measurements, optical surface characterization, visible, infrared, UV
Photometric Laboratory- Clean room ISO 5 - High Specular System: Light Tec has its own black room fully equiped. The laboratory is ISO 8 and 5 (clean room especially for the high specular system). BSDF, optical scattering measurements, optical surface characterization, visible, infrared, UV

Moreover, Light Tec has developed a high specular bench for high specular materials. It is well suited for back/forward scatter light characterization for all types of materials and objects. The system measures BRDF & BTDF which perfectly represents the way any surface scatters incoming light in 2D space.

The project has been also extended with the CNRS for a co-development in infrared wavelengths (3.39 and 10.6 µm).

Today, we can provide wavelengths in the range of UV (280 nm) up to IR (10.6 µm) with a dynamic of 1013.

The system has a resolution to a minimum angle down to 0.02° from the specular and the bench length is about 10 meters.

This system is only available on the measurement service.

Applications:

  • High polished mirrors and optics, transparent surfaces (glass, lenses, and crystals) which have very low scattering such as 10-9 sr-1.
  • Black materials and coatings with a very low BRDF are really difficult to measure because they absorb almost all the light (99% of absorption).
  • For baffles (edge scattering) or structure.
  • And more!

Our staff will be glad to answer your technical questions and inform you about pricing.

Our services are available worldwide! Please contact our distributors directly if you are outside of Europe in order to have a quote! Thank you for your comprehension.

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