SCATTERING MEASUREMENTS
Light Tec offers services such as scattering measurements (BSDF for Bidirectional Scattering Distribution Function) and also provides its own instruments (scattering measurement systems).
Being a pioneer in the optical branch that is the scattering measurement, Light Tec has become an expert in this field and performed a large number of projects over the years. The expertise of our team into the Optics (several optical engineers and PhD laser optics) and the quality of our photometric laboratory allow Light Tec to offer the best solutions for our customers.
Scattering measurement is an additional service to our optical design software LightTools, LucidShape and Code V. It was created to complete the libraries’ software in order to design optics with real and accurate data.
On top of that, Light Tec has its own Research & Development Department where the Mini-Diff and REFLET 180S are being developed. Both instruments can be used to do scattering measurement by yourself if you need to analyze lots of samples whatever your applications are.
These devices are also used by our technical team in our photometric laboratory. If you would like a demonstration in our office (Hyères, France), you can ask our team for an appointment.
Customer’s references: Automotive Lighting, BARCO, Bayer, Bosch, Broadcom, CREE, ESA, Nikon, Osram, Philips, Thales, VARROC, Sordern, Visteon….
MINI-DIFF
Mini-Diff is a compact and portable optical system for scattering characterization: measure the BRDF & BTDF of any kind of materials and objects. It allows, in a fast and easy way, to measure luminous energy distribution, and consequently characterizes surfaces of your examined regions such as roughness, defects, as well as types of coatings or paintings and more.
From the Plug & Play functionality to the technical specifications, Mini-Diff is a great device which allows you to save time and money thanks to the facility to measure and the quality of the results. If you often need to measure samples or surfaces outside the office, Mini-Diff is the best solution for you!
Mini-Diff is delivered with its own suitcase and with 3 calibration standard samples:
One Black standard / One reflective Lambertian Standard / One Transmissive Lambertian Standard
A notice and software are included as well.
The instrument is provided at a standard red light color (630nm).
The Mini-Diff is really easy to use: you can realize a measure in less than 3 minutes:
- Plug the Mini-Diff in a computer
- Start the Mini-Diff’ software on the computer
- Calibrate the instrument with the two standards samples
- Take the measure on your material or object
- See the result on your computer
- Export the result in one illumination design software
Measurements can be exported to those following format:
ASTM / Light Tools ® native / Zemax ® native / TracePro ® native / Slice Format (intensity) / Gaussian / Lambertian / ABg Harvey Shack model
Measurements can be integrated into the following software: LightTools®, TracePro®, FRED®, ASAP®, SPEOS®, SPECTER®, DIALUX®, RELUX®, LiteStar®, Photopia® and LumenMicro®.
EXAMPLES
Please, access to more info on the following examples in details:
- Lambertian standard
- Surface of a table
- Plastic of a credit card
- Anisotropic reflector as Reflector Miro 5
- Diffuser as Luminit Beam Shaper
You can download the Evaluation package with all the examples as reflector, diffuser and paint.
REFLET 180S®
REFLET 180S is a unique stand-alone scattering measurements system.
REFLET 180S is especially suited for back/forward scatter light characterization for all types of materials and objects. It allows you to measure the light distribution contained in the radiation lobe of these materials in photometric and colorimetric terms. Moreover, the system measures BRDF & BTDF which perfectly represents the way any surface scatters incoming light in 3D space.
The accurate analysis of the shape of the radiation lobe surface in terms of roughness, defects (presence as grooves or scratches), ordered microstructures and more. The determination of the spectral composition observed in every direction gives information on the type of paint or covering, and eventually, can characterize the signature of fluorescence, OVI inks, or iridescence with angular variation of colours, and both thin and filtered layers. Lastly, the spectrophotometric cartography of the backscattered light analyses the chemical composition on the surface area of the object for oxidation, dirt, pollution and more.
The system is structured in a modular fashion. It can easily be modified to user requirements, measurement with integrated flux or spectral analysis, or with a white light coloured lighting. The REFLET 180S optical bench is also easy to use as manually for spot inspection or quick analysis.
REFLET 180S allows you to analyse by yourself all samples you need to characterize, with a higher accuracy, exactness and reliability (than Mini-Diff). The device is suited for laboratory uses. It will allow you to get efficient data to import into your optical design software. Afterwards, you will be able to get free time through the production in masked time, as well as earn money, thanks to the quality of REFLET 180S and its analyses that will operate in your final projects!
The instrument is delivered with its dark box.
REFLET 180S software enables measurements exportation to optical design or other illumination software.
EXAMPLES
You can download application notes (pdf) for more information on our system:
| Instruments | Mini-Diff® | REFLET® | High Specular |
|---|---|---|---|
| Type | BRDF/BTDF | BRDF/BTDF | BRDF |
| Dynamic Range | 104 | 109 | 1013 |
| WaveLength Range | 622 - 850 - 940 nm | 400 to 1700 nm | 280 to 10,6 µm |
| Incident Angles | Fixed: 0°, 20°, 40°, 60° | Tunable: +90° to -90° | Tunable: +90° to 0° |
| Angular range | Sphere [0° ; 75°] [0° ; 360°] | Full sphere | 1 Plan from -10° to +90° |
| Angular Accuracy | < 2° | < 0.1° | < 0.02° |
| Repeatabiltiy | < 5 % | < 1 % | < 1 % |
| Weight | 2 Kg | 80 Kg | 200 Kg |
| Advantages | Plug & Play Easy to use & Fast Portable & Compact Attractive cost | High dynamic range High precision High repeatability Customisable wavelength range | Very high dynamic range Measurement at 0,02° from the specular High precision High repeatability Customisable wavelength range |
Services
Scattering measurement is also known as BSDF for Bidirectional Scattering Distribution Function. The BSDF determines the surface characterization of materials, objects or all kinds of surfaces through the light dispersion. The measurement can be done in reflection (BRDF) or in transmission (BTDF).
Scattering measurements available from us:
- 2D & 3D BSDF (Front & Back) measurements
- High resolution BSDF
- Spectral BSDF
- TIR (Total Intern Reflectivity) measurements
- TIS (Total Intensity Scattered) measurements
- From UV (280 nm), trough Visible, up to IR 3.39 and 10.6 microns
Our measured data are delivered in text format. Then, all data can be imported in every optical design software!
Light Tec has also developed an refractometer dedicated to the refractive index measurements of optical plastic (PMMA) plates with absolute accuracy of ±0.001 and with high repeatability (better than 1%).
In May 2014, Light Tec moved to a new place and created a new laboratory especially dedicated to measurement.
The laboratory is a black room to avoid any inconvenient stray light and the temperature is controlled and regulated for optimal measurement environment.
We have now a class 100 (ISO 5).
In our laboratory, we do have several instruments : integrating spheres (6”, 8” and 40” inch), two goniophotometers (REFLET 180S), a high specular scatterometer, a lux meter and luminance meter, a spectrophotometer, a videophotometer and many sources, filters and lasers.
Moreover, Light Tec has developed a high specular bench for high specular materials. It is well suited for back/forward scatter light characterization for all types of materials and objects. The system measures BRDF & BTDF which perfectly represents the way any surface scatters incoming light in 2D space.
The project has been also extended with the CNRS for a co-development in infrared wavelengths (3.39 and 10.6 µm).
Today, we can provide wavelengths in the range of UV (280 nm) up to IR (10.6 µm) with a dynamic of 1013.
The system has a resolution to a minimum angle down to 0.02° from the specular and the bench length is about 10 meters.
This system is only available on the measurement service.
Applications:
- High polished mirrors and optics, transparent surfaces (glass, lenses, and crystals) which have very low scattering such as 10-9 sr-1.
- Black materials and coatings with a very low BRDF are really difficult to measure because they absorb almost all the light (99% of absorption).
- For baffles (edge scattering) or structure.
- And more!
Our staff will be glad to answer your technical questions and inform you about pricing.
Our services are available worldwide! Please contact our distributors directly if you are outside of Europe in order to have a quote! Thank you for your comprehension.