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Reflet is a unique stand alone scattering measurements system.
Applications: The OPTICAL BENCH REFLET is specially suited for backscatter/forwardscatter light characterisation for all types of materials and objects. It allows measuring the light distribution contained in the radiation lobe of these materials in photometric and colorimetric terms.
Features: The accurate analysis of the shape of the radiation lobe examines surface in terms of roughness, defects (presence as grooves or scratches), ordered microstructures and more. The determination of the spectral composition observed in every direction gives information on the type of paint or covering, and eventually, can characterize the signature of fluorescence, OVI inks, or iridescence with angular variation of colors, and both thin and filtered layers. Lastly, the spectrophotometric cartography of the backscattered light analyses the chemical composition on the surface area of the object for oxydation, dirt, pollution and more.
Description : The system is architectured in a modular fashion. It can easily be modified to user requirements, measurement with integrated flux or spectral analysis, or with a white light colored lighting. The reflet optical bench is also easy to use as manually for spot inspection or quick analysis.
2 models ( 90 and 180)
and 2 configurations ( scattering or quasi specular)
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REFLET 90 .................................REFLET 180
Technical Secifications
Price information
Measurements service on demand
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